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https://www.azom.com/article.aspx?ArticleID=21990
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Using Focused Ion Beam Without Gallium For “Damage-Free” TEM Specimen Preparation - AZoM
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10/5/22 at 10:09am
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Focused Ion Beam Without Gallium
Chengge Jiao
staff scientist
TEM Specimen Preparation
application development
gallium
ion beam
Thermo Fisher Scientific
specimen preparation
AZoM spoke with staff scientist for application development, Dr. Chengge Jiao of Thermo Fisher Scientific, about the use of a focused ion beam without gallium to move towards damage-free TEM specimen preparation.
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