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https://www.azom.com/article.aspx?ArticleID=21990
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Using Focused Ion Beam Without Gallium For “Damage-Free” TEM Specimen Preparation - AZoM
10/5/22 at 10:09am
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AZoM spoke with staff scientist for application development, Dr. Chengge Jiao of Thermo Fisher Scientific, about the use of a focused ion beam without gallium to move towards damage-free TEM specimen preparation.
Science
Focused Ion Beam Without Gallium
Chengge Jiao
staff scientist
TEM Specimen Preparation
application development
gallium
ion beam
Thermo Fisher Scientific
specimen preparation
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