https://www.nature.com/articles/s41598-022-23691-y
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Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation | Scientific Reports - Nature.com
11/5/22 at 11:42am
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Nature.com
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Scientific Reports - Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation
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