https://www.nature.com/articles/s41598-022-23691-y
0
0
Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation | Scientific Reports - Nature.com
11/5/22 at 11:42am
Organization
Nature.com
Authors
Details
40 words
Summarize
Science Electronics & Electrical 4H-SiC Scientific Reports - Nature.com Scientific Reports - Suppression PiN diodes proton implantation
Scientific Reports - Suppression of stacking-fault expansion in 4H-SiC PiN diodes using proton implantation to solve bipolar degradation
Create an account or login to join the discussion